Engineers leverage both device-specific and tool-level data to identify a process “sweet spot.” Tight, frequent tool-to-tool ...
Abstract: The continuous scaling of integrated circuits (ICs) into very-large-scale integration (VLSI) has significantly increased test complexity and raised serious security concerns. Although design ...
Abstract: The rising complexity of modern System-on-Chip (SoC) designs has made it increasingly important to deploy intelligent Design-for-Testability (DFT) strategies that support both pre-silicon ...
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